Research Catalog

  • X-ray fluorescence determination of trace impurities Nb, Fe, Mn, and Ti in high purity Ta2O5 and K2TaF7 [microform] / by R. M. Agrawal and P. P. Khanna.

    • Text
    • Bombay : Bhabha Atomic Research Centre, 1973.
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text *ZV-339Offsite
  • Principles and practice of X-ray spectrometric analysis [by] Eugene P. Bertin.

    • Text
    • New York, Plenum Press [1970]
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text PET 70-59Offsite
  • Instrumentation for studies of solar extreme ultraviolet radiation [by] Pieter R. Wiederhold [and] John F. McGrath, Jr.

    • Text
    • Cambridge, Mass., Comstock and Wescott, 1968.
    • 1968
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 72-477Offsite
  • X-rays, electrons, and analytical chemistry; spectrochemical analysis with X-rays [by] H. A. Liebhafsky [and others] Collaborating editor, Sybil Small Liebhafsky.

    • Text
    • New York, Wiley-Interscience [1972]
    • 1972
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 73-451Offsite
  • X-ray emission wavelengths and kev tables for nondiffractive analysis [microform] Prepared by G. G. Johnson, Jr., and E. W. White.

    • Text
    • Philadelphia, American Society for Testing and Materials [1970]
    • 1970
  • Band structure spectroscopy of metals and alloys. Edited by D. J. Fabian [and] L. M. Watson.

    • Text
    • London, New York, Academic Press, 1973.
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 74-514Offsite
  • The analysis of high alloy steels by X-ray fluorescence using a correction factor technique, prepared by W. Johnson on behalf of the X-ray Fluorescence Analysis of Iron, Steel and Ferro-Alloys Study Group.

    • Text
    • London, BISRA, 1970.
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 74-207Offsite
  • X-ray spectrometry : XRS.

    • Text
    • [London] : Heyden, 1972-
    • 1972-present
    • 22 Items
    FormatCall NumberItem Location
    Text JSP 74-768 v. 32 (2003)Offsite
    FormatCall NumberItem Location
    Text JSP 74-768 v. 33 (2004)Offsite
    FormatCall NumberItem Location
    Text JSP 76-768 v. 34 (2005)Offsite
  • The solid state: X-ray spectroscopy [by] L. Jacob.

    • Text
    • New York, Wiley [1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 75-111Offsite
  • All you ever wanted to know about X-ray energy spectrometry [1st ed.

    • Text
    • Burlingame, Calif., Kevex Corp., 1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 75-47Offsite
  • An introduction to x-ray spectrometry / [by] Ron Jenkins.

    • Text
    • London ; New York : Heyden, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 75-613Offsite
  • X-ray spectroscopy, edited by Leonid V. Azároff.

    • Text
    • New York, McGraw-Hill [1973, c1974]
    • 1973-1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 76-1322Offsite
  • Principles and practice of X-ray spectrometric analysis / Eugene P. Bertin. 2d ed.

    • Text
    • New York : Plenum Press, [1975]
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 76-1589Offsite
  • Röntgenanalyse. [1. Aufl.]

    • Text
    • [Berlin, München] Siemens Aktiengesellschaft [1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSK 77-73Offsite
  • X-ray fluorescence analysis of environmental samples / edited by Thomas G. Dzubay.

    • Text
    • Ann Arbor, Mich. : Ann Arbor Science Publishers, c1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-1228Offsite
  • X-ray spectrometry / editors, H. K. Herglotz, L. S. Birks.

    • Text
    • New York : M. Dekker, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 78-601Offsite
  • Electron microscopy and x-ray applications to environmental and occupational health analysis / edited by Philip A. Russell, Alan E. Hutchings.

    • Text
    • Ann Arbor, Mich. : Ann Arbor Science Publishers, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-138Offsite
  • Röntgenspektren und chemische Bindung / Armin Meisel, Gunter Leonhardt, Rüdiger Szargan. 1. Aufl.

    • Text
    • Leipzig : Akademische Verlagsgesellschaft Geest u. Portig, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-973Offsite
  • Introduction to X-ray spectrometric analysis / Eugene P. Bertin.

    • Text
    • New York : Plenum Press, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-1525Offsite
  • Eighth International Conference on X-ray Optics and Microanalysis and Twelfth annual conference of the Microbeam Analysis Society, August 18-24, 1977, Boston Sheraton, Boston, Massachusetts.

    • Text
    • [S. l. ; s. n. ; 1977?]
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 81-307Offsite
  • EXAFS spectroscopy, techniques and applications / edited by B. K. Teo and D. C. Joy.

    • Text
    • New York : Plenum Press, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 81-940Offsite
  • Inner-shell and x-ray physics of atoms and solids : [proceedings] / edited by Derek J. Fabian, Hans Kleinpoppen, and Lewis M. Watson.

    • Text
    • New York : Plenum Press, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 82-236Offsite
  • Analysis of biological material for trace elements using x-ray spectroscopy / author, Vlado Valković.

    • Text
    • Boca Raton, Fla. : CRC Press, c1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 82-90Offsite
  • The determination, by X-ray-fluorescence spectrometry, of gold and uranium on resin [microform] / by Jurgens Johannes Jacobs and André Marie Eloi Balaes.

    • Text
    • Randburg : Council for Mineral Technology, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text *ZV-346Offsite
  • The Determination, by X-Ray fluorescence spectrometry, of tin and tungsten in ores, concentrates, and residues of scheelite, wolframite, and cassiterite [microform] / by André Marie Eloi Balaes ... [et al.]

    • Text
    • Randburg : Council for Mineral Technology, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text *ZV-346Offsite
  • Principles of quantitative X-ray fluorescence analysis / R. Tertian, F. Claisse.

    • Text
    • London ; Philadelphia : Heyden, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 84-817Offsite
  • Protoninducerad karakteristisk röntgenstrålning / av Roland Akselsson.

    • Text
    • Lund : Studentlitteratur, 1973
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 85-24Offsite
  • Fundamentals of energy dispersive x-ray analysis / John C. Russ.

    • Text
    • London ; Boston : Butterworths, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 86-374Offsite
  • X-ray optics and microanalysis : transactions of the VII International Conference on X-ray Optics and Microanalysis, Moscow-Kiev, July 9-16, 1974 / editors, I.B. Borovskii and N.I. Komyak.

    • Text
    • New Delhi : Oxonian Press, c1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-1319Offsite
  • Radiative properties of hot dense matter III : proceedings of the 3d international conference / editors, Balazs Rozsnyai ... [et al.].

    • Text
    • Singapore : World Scientific, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 88-800Offsite
  • X-ray spectroscopy in atomic and solid state physics / edited by J. Gomes Ferreira and M. Teresa Ramos.

    • Text
    • New York : Plenum Press, c1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 89-280Offsite
  • Radionuclide x-ray fluorescence analysis with environmental applications / by J. Tölgyessy, E. Havránek, and E. Dejmková.

    • Text
    • Amsterdam ; New York : Elsevier, 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSK 90-92 v. 26Offsite
  • High resolution X-ray spectroscopy of cosmic plasmas : the proceedings of International Astronomical Union 115th Colloquium [held August 22-25, 1988 at the Harvard University Science Center in Cambridge, Massachusetts] / edited by Paul Gorenstein and Martin Zombeck.

    • Text
    • Cambridge [England] ; New York : Cambridge University Press, 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 91-576Offsite
  • Iron line diagnostics in X-ray sources : proceedings of a workshop held in Varenna, Como, Italy, 9-12 October 1990 / A. Treves, G.C. Perola, L. Stella, eds.

    • Text
    • Berlin ; Heidelberg : Springer-Verlag, c1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 91-2160Offsite
  • Handbook of photon interaction coefficients in radioisotope-excited x-ray fluorescence analysis / O.S. Marenkov and N.I. Komyak.

    • Text
    • New York : Nova Science Publishers, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 91-2029Offsite
  • XRF analysis of ceramics, minerals, and allied materials / Harry Bennett, Graham J. Oliver.

    • Text
    • Chichester, England ; New York : Wiley, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 93-1487Offsite
  • X-ray spectra and chemical binding / A. Meisel, G. Leonhardt, R. Szargan.

    • Text
    • Berlin ; New York : Springer-Verlag, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 93-1598Offsite
  • High resolution XPS of organic polymers : the Scienta ESCA300 database / G. Beamson and D. Briggs.

    • Text
    • Chichester [England] ; New York : Wiley, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 94-28Offsite
  • Handbook of X-ray spectrometry : methods and techniques / edited by René E. van Grieken, Andrzej A. Markowicz.

    • Text
    • New York, NY : Marcel Dekker, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 94-142Offsite
  • Quantitative X-ray fluorescence analysis : theory and application / Gerald R. Lachance, Fernand Claisse.

    • Text
    • Chichester ; New York : Wiley, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 95-1387Offsite
  • X-ray spectrometry in electron beam instruments / edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury.

    • Text
    • New York : Plenum Press, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 95-516Offsite
  • UV and x-ray spectroscopy of astrophysical and laboratory plasmas : proceedings from the tenth international colloquium held at Berkeley, California, 3-5 February 1992 / edited by Eric H. Silver and Steven M. Kahn.

    • Text
    • Cambridge [England] ; New York : Cambridge University Press, 1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 95-116Offsite
  • Surface analysis by electron spectroscopy : measurement and interpretation / Graham C. Smith.

    • Text
    • New York : Plenum Press, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 95-628Offsite
  • Advances in X-ray spectroscopy : contributions in honour of Professor Y. Cauchois / editors, C. Bonnelle and C. Mandé.

    • Text
    • Oxford ; New York : Pergamon Press, 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 83-775Offsite
  • Introduction to the theory of x-ray and electronic spectra of free atoms / Romas Karazija ; translated from Russian by W. Robert Welsh.

    • Text
    • New York ; London : Plenum Press, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 96-457Offsite
  • X-ray and inner-shell processes : 17th International Conference : Hamburg, Germany, September, 1996 / editors, R.L. Johnson, H. Schmidt-Böcking, B.F. Sonntag.

    • Text
    • Woodbuty, New York : American Institute of Physics, c1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 97-385Offsite
  • Total reflection X-ray fluorescence analysis / Reinhold Klockenkämper.

    • Text
    • New York : Wiley, c1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 97-671Offsite
  • X-ray radiation of highly charged ions / H.F. Beyer, H.-J. Kluge, V.P. Shevelko

    • Text
    • Berlin ; New York : Springer, c1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 97-1222Offsite
  • Methods of X-ray spectroscopic research, by M.A. Blokhin. Translated by F.L. Curzon. Edited by M.A.S. Ross.

    • Text
    • Oxford, New York, Pergamon Press [1965]
    • 1965
    • 1 Item
    FormatCall NumberItem Location
    Text PEW (Blokhin, M. A. Methods of X-ray spectroscopic research)Offsite
  • Materialprüfung mit Röntgenstrahlen, unter besonderer Berücksichtigung der Röntgenmetallkunde.

    • Text
    • Berlin, Springer, 1958.
    • 1958
    • 1 Item
    FormatCall NumberItem Location
    Text PEW (Glocker, R. Materialprufung mit Rontgenstrahlen. 1958)Offsite

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