Research Catalog

  • Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt. 2d, rev. ed.

    • Text
    • Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U. S.A. and Canada, Elsevier North-Holland, 1978.
    • 1978
    • 2 Items
    FormatCall NumberItem Location
    Text JSD 79-741 v. 1Offsite
    FormatCall NumberItem Location
    Text JSD 79-741 v. 2Offsite
  • Lexicon dendrologicum [door] Frans Amelinckx & Severin Amelinckx.

    • Text
    • Antwerpen, De Sikkel, 1955.
    • 1955
    • 1 Item
    FormatCall NumberItem Location
    Text VQR (Amelinckx, F. Lexicon Dendrologicum)Offsite
  • Handbook of microscopy : applications in materials science, solid-state physics, and chemistry / edited by S. Amelinckx ... [et al.].

    • Text
    • Weinheim ; New York : VCH, c1997.
    • 1997
    • 2 Items
    FormatCall NumberItem Location
    Text JSE 16-112 v. 1Offsite
    FormatCall NumberItem Location
    Text JSE 16-112 v. 3Offsite
  • Modern diffraction and imaging techniques in material science. Proceedings of the International Summer Course on Material Science, held at Antwerp, Belgium, 28 July-8 August 1969, and sponsored by NATO Scientific Affairs Division. Editors: S. Amelinckx, R. Gevers, G. Remaut [and others]

    • Text
    • Amsterdam, North-Holland Pub. Co., 1970.
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text PAW (International Summer Course on Material Science, Antwerp, 1969. Modern diffraction and imaging techniques) 1970Offsite
  • Solid state dosimetry, edited by S. Amelinckx, B. Batz [and] R. Strumane.

    • Text
    • New York, Gordon and Breach Science Publishers [c1969]
    • 1969
    • 1 Item
    FormatCall NumberItem Location
    Text PLE (Solid state dosimetry)Offsite
  • Les dislocations et la croissance des cristaux [par] Willy Dekeyser [et] Séverin Amelinckx. Préf. du prof. J. Wyart.

    • Text
    • Paris, Masson, 1955.
    • 1955
    • 1 Item
    FormatCall NumberItem Location
    Text PWX (Dekeyser, W. Dislocations et la croissance des cristaux)Offsite
  • Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.

    • Text
    • Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.
    • 1978
    • 2 Items
    FormatCall NumberItem Location
    Text TA417.23.D54 1978 v.2Off-site
    FormatCall NumberItem Location
    Text TA417.23.D54 1978 v.1Off-site
  • Handbook of microscopy : applications in materials science, solid-state physics, and chemistry / edited by S. Amelinckx [and others].

    • Text
    • Weinheim ; New York : VCH, [1997], ©1997.
    • 1997-1997
    • 3 Items
    FormatCall NumberItem Location
    Text QH205.2 .H35 1997 v.3Off-site
    FormatCall NumberItem Location
    Text QH205.2 .H35 1997 v.2Off-site
    FormatCall NumberItem Location
    Text QH205.2 .H35 1997 v.1Off-site
  • Solid state dosimetry / edited by S. Amelinckx, B. Batz [and] R. Strumane.

    • Text
    • New York : Gordon and Breach Science Publishers, [1969], [©1969]
    • 1969-1969
    • 1 Item
    FormatCall NumberItem Location
    Text QC795 .S64Off-site
  • Modern diffraction and imaging techniques in material science. Proceedings of the International Summer Course on Material Science, held at Antwerp, Belgium, 28 July-8 August 1969, and sponsored by NATO Scientific Affairs Division. Editors: S. Amelinckx, R. Gevers, G. Remaut [and others]

    • Text
    • Amsterdam, North-Holland Pub. Co., 1970.
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4M63 1969Off-site
  • Solid state dosimetry, edited by S. Amelinckx, B. Batz [and] R. Strumane.

    • Text
    • New York, Gordon and Breach Science Publishers [c1969]
    • 1969
    • 1 Item
    FormatCall NumberItem Location
    Text 8291.8785 (1969)Off-site
  • Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.

    • Text
    • Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.
    • 1978
    • 2 Items
    FormatCall NumberItem Location
    Text TA417.23 .D54 1978 vol.2Off-site
    FormatCall NumberItem Location
    Text TA417.23 .D54 1978 vol.1Off-site
  • Solid state dosimetry, edited by S. Amelinckx, B. Batz [and] R. Strumane.

    • Text
    • New York, Gordon and Breach Science Publishers [©1969]
    • 1969
    • 1 Item
    FormatCall NumberItem Location
    Text 8291.8785 1969Off-site
  • Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.

    • Text
    • Amsterdam ; New York : North-Holland Pub. Co. : Sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.
    • 1978
    • 2 Items
    FormatCall NumberItem Location
    Text TA417.23 .D54 1978 vol.1Off-site
    FormatCall NumberItem Location
    Text TA417.23 .D54 1978 vol.2Off-site

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