Research Catalog

  • Dynamic test/analysis correlation using reduced analytical models [microform] / Paul E. McGowan, A. Filippo Angelucci, and Mehzad Javeed.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]
    • 1992

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