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Displaying 1-2 of 2 results for author "Bachmann, Klaus J."
P-polarized reflectance spectroscopy [microform] : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions / Nikolaus Dietz and Klaus J. Bachmann.
- Text
- [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
- 1995
The control of purity and stoichiometry of compound semiconductors by high vapor pressure transport [microform] : final report on NASA grant NAGW-2865 / Klaus J. Bachmann ... [et al.].
- Text
- [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
- 1995
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