Research Catalog

  • Pattern recognition : ideas in practice / edited by Bruce G. Batchelor.

    • Text
    • New York : Plenum Press, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-360Offsite
  • Machine vision for the inspection of natural products / Mark Graves and Bruce Batchelor (eds.).

    • Text
    • London ; New York : Springer, c2003.
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 03-654Offsite
  • Automated visual inspection / edited by B.G. Batchelor, D.A. Hill, and D.C. Hodgson.

    • Text
    • Kempston, Bedford, UK : IFS (Publications) Ltd. ; Amsterdam, The Netherlands : North-Holland, 1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 86-907Offsite
  • Machine vision architectures, integration, and applications : 12-15 November 1991, Boston, Massachusetts / Bruce G. Batchelor, Michael J.W. Chen, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : SPIE, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M3357 1992Off-site
  • Machine vision applications, architectures, and systems integration : 17-18 November 1992, Boston, Massachusetts / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M32 1992gOff-site
  • Machine vision applications, architectures, and systems integration II : 7-9 September 1993, Boston, Massachusetts / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering in cooperation with Automated Imaging Association [and others].

    • Text
    • Bellingham, Wash., USA : SPIE, [1993], ©1993.
    • 1993-1993
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M322 1993gOff-site
  • Machine vision applications, architectures, and systems integration IV : 23-24 October, 1995, Philadelphia, Pennsylvania / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1995], ©1995.
    • 1995-1995
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M3313 1995gOff-site
  • Machine vision applications, architectures, and systems integration V : 18-19 November 1996, Boston, Massachusetts / Susan Snell Soloman, Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M32 1996gOff-site
  • Machine vision applications, architectures, and systems integration VI : 15-16 October 1997, Pittsburgh, Pennsylvania / Susan Snell Soloman, Bruce G. Batchelor, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems.

    • Text
    • Bellingham, Wash., USA : SPIE, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M32 1997gOff-site
  • Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts / John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M3313 1999gOff-site
  • Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts / Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers.

    • Text
    • Bellingham, Wash. : SPIE, [1998], ©1998.
    • 1998-1998
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M3355 1998Off-site
  • Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA / Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M33 2001gOff-site
  • Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA / Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. USA : SPIE, [2004], ©2004.
    • 2004-2004
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .T96 2003gOff-site
  • Intelligent robots and computer vision VIII : systems and applications, 9-10 November 1989, Philadelphia, Pennsylvania / Bruce G. Batchelor, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, Center for Optical Data Processing/Carnegie Mellon University.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1990], ©1990.
    • 1990-1990
    • 1 Item
    FormatCall NumberItem Location
    Text TJ210.3 .I575 1990gOff-site
  • Machine vision systems integration in industry : 8-9 November 1990, Boston, Massachusetts / Bruce G. Batchelor, Frederich M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1991], ©1991.
    • 1991-1991
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M343 1991gOff-site
  • Machine vision applications, architectures, and systems integration IV : 23-24 October 1995, Philadelphia, Pennsylvania / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : The Society, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M334 1995Off-site
  • Machine vision applications, architectures, and systems integration V : 18-19 November 1996, Boston, Massacusetts / Susan Snell Solomon, Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : The Society, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .P762 vol.2908Off-site
  • Pattern recognition : ideas in practice / edited by Bruce G. Batchelor.

    • Text
    • New York : Plenum Press, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text Q327.P37Off-site
  • Automated visual inspection / edited by B.G. Batchelor, D.A. Hill, and D.C. Hodgson.

    • Text
    • Kempston, Bedford, UK : IFS (Publications) ; Amsterdam, The Netherlands : North-Holland ; New York, NY : [Distributed] in the USA and Canada, Elsevier Science Pub. Co., 1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text TS156.2 .A87Off-site
  • Intelligent robots and computer vision VIII : systems and applications, 9-10 November 1989, Philadelphia, Pennsylvania / Bruce G. Batchelor, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, Center for Optical Data Processing/Carnegie Mellon University.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TJ210.3.I575bOff-site
  • Machine vision systems integration in industry : 8-9 November 1990, Boston, Massachusetts / Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : The Society, c1991.
    • 1991
    • 1 Item

    Available Online

    http://proceedings.spiedigitallibrary.org/volume.aspx?volume=1386
    FormatCall NumberItem Location
    Text TA1632.M323Off-site
  • Machine vision architectures, integration, and applications : 12-15 November 1991, Boston, Massachusetts / Bruce G. Batchelor, Michael J.W. Chen, Frederick M. Waltz, chairs/editors ; sponsored ... by SPIE--the Interntional Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1992.
    • 1992
    • 1 Item

    Available Online

    http://proceedings.spiedigitallibrary.org/volume.aspx?volume=1615
    FormatCall NumberItem Location
    Text TA1632 .M324 1992Off-site
  • Machine vision applications, architectures, and systems integration : 17-18 November 1992, Boston, Massachusetts / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering.

    • Text
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M33 1992Off-site
  • Machine vision applications, architectures, and systems integration III : 31 October-2 November 1994, Boston, Massachusetts / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering.

    • Text
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634.M333 1994Off-site
  • Machine vision applications, architectures, and systems integration II : 7-9 September 1993, Boston, Massachusetts / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering in cooperation with Automated Imaging Association ... [et al.].

    • Text
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M332 1993Off-site
  • Machine vision applications, architectures, and systems integration IV : 23-24 October 1995, Philadelphia, Pennsylvania / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : The Society, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M334 1995Off-site
  • Machine vision applications, architectures, and systems integration V : 18-19 November 1996, Boston, Massacusetts / Susan Snell Solomon, Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : The Society, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .P762 vol.2908Off-site
  • Intelligent robots and computer vision VIII : systems and applications, 9-10 November 1989, Philadelphia, Pennsylvania / Bruce G. Batchelor, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, Center for Optical Data Processing/Carnegie Mellon University.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TJ210.3 .I575bOff-site
  • Machine vision systems integration in industry : 8-9 November 1990, Boston, Massachusetts / Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : The Society, c1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M323Off-site
  • Machine vision architectures, integration, and applications : 12-15 November 1991, Boston, Massachusetts / Bruce G. Batchelor, Michael J.W. Chen, Frederick M. Waltz, chairs/editors ; sponsored ... by SPIE--the Interntional Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TA1632 .M324 1992Off-site
  • Machine vision applications, architectures, and systems integration : 17-18 November 1992, Boston, Massachusetts / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : The Society, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M33 1992Off-site
  • Machine vision applications, architectures, and systems integration III : 31 October-2 November 1994, Boston, Massachusetts / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : The Society, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M333 1994Off-site
  • Machine vision applications, architectures, and systems integration II : 7-9 September 1993, Boston, Massachusetts / Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering in cooperation with Automated Imaging Association ... [et al.].

    • Text
    • Bellingham, Wash., USA : SPIE, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text TA1634 .M332 1993Off-site

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