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Displaying 1-2 of 2 results for author "Beaman, Donald Robert."
Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 75-1300 Offsite Eighth International Congress on X-ray Optics and Microanalysis / edited by Donald R. Beaman, Robert E. Ogilvie, and David B. Wittry.
- Text
- Midland, Mich. : Pendell Pub. Co., 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text QD79.M5 I57 1977 Off-site
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