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Displaying 1-3 of 3 results for author "Beanland, R."
Microscopy of semiconducting materials 1999 : proceedings of the Institute of Physics Conference held at Oxford University, 22-25 March, 1999 / edited by A.G. Cullis and R. Beanland.
- Text
- Bristol ; Philadelphia, PA : Institute of Physics Publishing, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSE 00-473 Offsite Microscopy of semiconducting materials 1999 : proceedings of the Institute of Physics conference held at Oxford University, 22-25 March 1999 / edited by A.G. Cullis and R. Beanland.
- Text
- Bristol ; Philadelphia : Institute of Physics Pub., [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text QC611.6.S9 M53 1999 Off-site Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.
- Text
- London ; New York : Taylor & Francis, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 G62 2001 2001 Off-site
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