Research Catalog

  • Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II ; testing, packaging, and reliability of semiconductor lasers V : 26-25 [sic], January, 2000, San Jose, California / Geoffrey T. Burnham [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Washington : SPIE, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text TA1700 .L3715 2000gOff-site

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