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Displaying 1-2 of 2 results for author "Chartier, Duane R."
Scientific detection of fakery in art : 29-30 January 1998, San Jose, California / Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : The Society, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text N8790 .S35 1998 Off-site Scientific detection of fakery in art II : 20-21 September 1999, Boston, Massachusetts / Duane R. Chartier, Walter McCrone, Richard J. Weiss, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text N8790 .S35 2000 Off-site
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