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Displaying 1-19 of 19 results for author "Chen, Michael J. W."
Machine vision architectures, integration, and applications : 12-15 November 1991, Boston, Massachusetts / Bruce G. Batchelor, Michael J.W. Chen, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text TA1632 .M3357 1992 Off-site Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
- Text
- Bellingham, Wash., USA : The Society, [1987], ©1987.
- 1987-1987
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A9 1987 Off-site Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts / Michael J.W. Chen, Rolf-Juergen Ahlers ; sponsored by SPIE--the International Society for Optical Engineering ; in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University [and others].
- Text
- Bellingham, Wash., USA : The Society, [1988], ©1988.
- 1988-1988
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A895 1988g Off-site Automated inspection and high speed vision architectures II : 10-11 November 1988 Cambridge, Massachusetts / Michael J.W. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering l cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University.
- Text
- Bellingham, Wash., USA : SPIE, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text TA1632 .A9411 1989g Off-site Automated inspection and high-speed vision architectures III : 6-7 November 1989, Philadelphia, Pennsylvania / Michael J.W. Chen, chair/editor ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organizations, IEEE Philadelphia Section, The Industrial Electronics Society of the IEEE, Center for Optical Data Processing/Carnegie Mellon University.
- Text
- Bellingham, Wash., USA : SPIE--The International Society for Optical Engineering, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A894 1990g Off-site High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts / Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .H54 1991g Off-site International Conference on Automatic Inspection and Measurement : August 20-21, 1985, San Diego, California / Richard A. Brook, Michael J.W. Chen, chairmen/editors ; cosponsored by Sira Ltd.--the Research Association for Instrumentation ; cooperating organizations, Optical Sciences Center, University of Arizona [and] Institute of Optics, University of Rochester.
- Text
- 1985
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .I56 1985 Off-site Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
- Text
- 1987
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A89 1987 Off-site Automated inspection and high speed vision architectures II : 10-11 November 1988, Cambridge, Massachusetts / Michael J.W. Chen, Chair/Editor ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University.
- Text
- 1989
- 1 Item
Item details Format Call Number Item Location Text TS156.2.A893 Off-site Automated inspection and high speed vision architectures : 3-4 November, 1987, Cambridge, Massachusetts / Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University ... [et al.].
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A889 1988 Off-site High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts / Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- 1991
- 1 Item
Item details Format Call Number Item Location Text TS156.2.H54 1991 Off-site Machine vision architectures, integration, and applications : 12-15 November 1991, Boston, Massachusetts / Bruce G. Batchelor, Michael J.W. Chen, Frederick M. Waltz, chairs/editors ; sponsored ... by SPIE--the Interntional Society for Optical Engineering.
- Text
- 1992
- 1 Item
Item details Format Call Number Item Location Text TA1632 .M324 1992 Off-site International Conference on Automatic Inspection and Measurement : August 20-21, 1985, San Diego, California / Richard A. Brook, Michael J.W. Chen, chairmen/editors ; cosponsored by Sira Ltd.--the Research Association for Instrumentation ; cooperating organizations, Optical Sciences Center, University of Arizona [and] Institute of Optics, University of Rochester.
- Text
- Bellingham, Wash., USA : SPIE--International Society for Optical Engineering, ©1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .I56 1985 Off-site Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A89 1987 Off-site Automated inspection and high speed vision architectures II : 10-11 November 1988, Cambridge, Massachusetts / Michael J.W. Chen, Chair/Editor ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University.
- Text
- Bellingham, WA : SPIE--The International Society for Optical Engineering, 1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A893 Off-site Automated inspection and high speed vision architectures : 3-4 November, 1987, Cambridge, Massachusetts / Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University ... [et al.].
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A889 1988 Off-site Automated inspection and high-speed vision architectures III : 6-7 November 1989, Philadelphia, Pennsylvania / Michael J.W. Chen, chair/editor ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organizations, IEEE Philadelphia Section, The Industrial Electronics Society of the IEEE, Center for Optical Data Processing/Carnegie Mellon University.
- Text
- Bellingham, Wash., USA : SPIE--The International Society for Optical Engineering, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .A894 Off-site High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts / Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .H54 1991 Off-site Machine vision architectures, integration, and applications : 12-15 November 1991, Boston, Massachusetts / Bruce G. Batchelor, Michael J.W. Chen, Frederick M. Waltz, chairs/editors ; sponsored ... by SPIE--the Interntional Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text TA1632 .M324 1992 Off-site
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