Research Catalog

  • Non-destructive damping measurement for wafer-level packaged microelectromechanical system (MEMS) acceleration switches / Ryan Knight and Evan Cheng.

    • Text
    • Adelphi, MD : Army Research Laboratory, September 2014.
    • 2014-9
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo61207

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