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Displaying 1-4 of 4 results for author "Electron Microscopy Society of America. http://id.loc.gov/authorities/names/n50055810"
Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 Si1 1975 Off-site Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.E4S53 1975 Off-site Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy.
- Text
- New York : Plenum Press, c1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text TA417.23 .I57 Off-site Electron microscopy 1990 : proceedings of the XIIth International Congress for Electron Microscopy, held in Seattle, Washington, USA, 12-18 August 1990 / editors, L.D. Peachey, D.B. Williams.
- Text
- San Francisco, CA : San Francisco Press, c1990.
- 1990
- 4 Items
Item details Format Call Number Item Location Text QH212.E4 I5 1990 Off-site Item details Format Call Number Item Location Text QH212.E4 I5 1990 Off-site Item details Format Call Number Item Location Text QH212.E4 I5 1990 Off-site
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