Research Catalog

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  • Method for measuring axis orthogonality in MEMS accelerometers / Craig D. McGray; Yaqub Afridi; Jon Geist.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
    • 2013
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo104592

  • Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / Jon Geist; M. Yaqub Afridi.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.
    • 2015
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo99585

  • Standard Reference Materials(R) User's Guide for RM 8096 and 8097 : The MEMS 5-in-1, 2013 Edition / Janet M. Cassard ... [and others].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
    • 2013
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo95021

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