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Displaying 1-5 of 5 results for author "Gösele, U."
Proceedings of the Second Symposium on Defects in Silicon : defects in silicon II / edited by W. Murray Bullis, Ulrich Gösele, Fumio Shimura ; assistant editors, W. Bergholz [and others].
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- Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text QC611.8.S5 S96 1991 Off-site Proceedings of the First International Symposium on Semiconductor Wafer Bonding--Science, Technology, and Applications / edited by Ulrich Gösele ... [and others ; sponsored by the] Electronics and Dielectric Science and Technology divisions.
- Text
- Pennington, NJ : Electrochemical Society, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I5838 1991 Off-site Semiconductor wafer bonding : science and technology / Q.-Y. Tong, U. Gösele.
- Text
- New York : John Wiley, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .T66 1999 Off-site Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China / Qin-Yi Tong, Ulrich M. Goesele, chairs/editors ; sponsored and organized by SPIE--the International Society for Optical Engineering, SEU--Southeast University (China), [and] COEMA--China Optics and Optoelectronics Manufacturers Association ; cooperating organizations, Electronic Society, Jiangsu Province (China) [and] Laser and Optical Engineering Society, Jiangsu Province (China).
- Text
- Bellingham, Wash., USA : SPIE, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TK7875 .I54 2001g Off-site Wafer bonding : applications and technology / M. Alexe, U. Gösele (eds.).
- Text
- Berlin ; New York : Springer-Verlag, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .W27 2004 Off-site
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