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Displaying 1-2 of 2 results for author "Head, A. K."
Computed electron micrographs and defect identification [by] A. K. Head [and others]
- Text
- Amsterdam, North-Holland Pub. Co.; New York, American Elsevier Pub. Co., 1973.
- 1973
- 1 Item
Item details Format Call Number Item Location Text JSD 75-264 Offsite Not available - Please for assistance.Computed electron micrographs and defect identification. By A. K. Head, P. Humble, L. M. Clarebrough, a.o.
- Text
- Amsterdam, North-Holland Pub. Co., 1973.
- 1973
- 1 Item
Item details Format Call Number Item Location Text QD921.C62 Off-site Not available - Please for assistance.
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