Research Catalog

  • Method of recertifying a loaded bearing member using a phase point [microform] / inventor, Joseph S. Heyman.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1991]
    • 1992
  • Electronics reliability and measurement technology [microform] : proceedings of a conference ... held at Langley Research Center, Hampton, Virginia, June 3-5, 1986 / edited by Joseph S. Heyman.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor, 1987]
    • 1987
  • Electronics reliability and measurement technology : nondestructive evaluation / edited by Joseph S. Heyman.

    • Text
    • Park Ridge, N.J., U.S.A. : Noyes Data Corp., [1988], ©1988.
    • 1988-1988
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .E486 1988Off-site
    Not available - Please for assistance.

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