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  • Absolute specular reflectometer with an autocollimator telescope and auxiliary mirrors [microform] / Tie Ming Wang, Kenneth L. Eckerle, Jack J. Hsia.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
    • 1990

  • 45⁰/0⁰ reflectance factors of pressed polytetrafluoroethylene (PTFE) powder [microform] / P. Yvonne Barnes and Jack J. Hsia.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1995.
    • 1995

  • Standard reference materials : preparation and calibration of standards of spectral specular reflectance / J. C. Richmond, J. J. Hsia.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1972.
    • 1972
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo97022

  • Standard reference materials : preparation and calibration of first-surface aluminum mirror specular reflectance standards / Victor R. Weidner, Jack J. Hsia.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982.
    • 1982
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo95445

  • Standard reference materials : second-surface mirror standards of spectral specular reflectance (SRM's 2023, 2024, 2025) / Joseph C. Richmond, Jack J. Hsia, David B. Wilmering.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982.
    • 1982
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo104132

  • Standard reference materials : polystyrene films for calibrating the wavelength scale of infrared spectrophotometers - SRM 1921 / Devinder Gupta, Lan Wang, Jack J. Hsia, Raju U. Datla.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1995.
    • 1995
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo103634

  • [45 degree] 0 [degree] reflectance factors of pressed polytetrafluoroethylene (PTFE) powder / P. Yvonne Barnes, J. J. Hsia.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1995.
    • 1995
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo97043

  • Optical radiation measurements : Describing spectrophotometric measurements / Jr William Venable, Jack J. Hsia.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1974.
    • 1974
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo94623

  • Optical radiation measurements : Development of an NBS reference spectrophotometer for diffuse transmittance and reflectance / Jr William Venable, Jack J. Hsia, Victor R. Weidner.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1976.
    • 1976
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo105365

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