Research Catalog

  • Electrical and Electronic Measurement and Test Instrument Conference and Exposition : EEMTIC'81 digest : Ottawa, Canada / sponsors, IEEE Ottawa Section, Instrumentation and Measurement Society, Canadian and U.S. URSI- Commission A.

    • Text
    • New York, N.Y. : Institute of Electrical and Electronics Engineers, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 82-28Offsite
  • Conference record, IEEE Instrumentation and Measurement Conference : March 25-27, 1986, University of Colorado Events/Conference Center, Hilton Harvest House Hotel, Boulder, Colorado, USA.

    • Text
    • New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : IEEE Service Center, 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 86-1038Offsite
  • IEEE Instrumentation and Measurement Technology Conference, April 20-22, 1988, San Diego Princess Hotel, San Diego, California.

    • Text
    • New York, N.Y. : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : Additional copies from IEEE Service Center, c1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 88-1544Offsite
  • IEEE Instrumentation and Measurement Technology Conference : conference record : May 12-14, 1992, Meadowlands Hilton Hotel, Metropolitan New York, USA.

    • Text
    • Piscataway, N.J. : IEEE Service Center, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 93-13Offsite
  • Conference record : IMTC/93, Hyatt Regency Hotel Irvine, Orange County, California, May 18-20, 1993 / IEEE Instrumentation and Measurement Technology Conference.

    • Text
    • [New York, N.Y.] : IEEE ; Piscataway, NJ, USA : Additional copies may be ordered from IEEE Service Center, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 93-850Offsite
  • IEEE transactions on instrumentation and measurement.

    • Text
    • New York, Institute of Electrical and Electronics Engineers.
    • 1963-present
    • 39 Items
    FormatCall NumberItem Location
    Text JSM 94-405 v. 57, no. 3 (Mar. 2008)Offsite
    FormatCall NumberItem Location
    Text JSM 94-405 v. 57, no. 2 (Feb. 2008)Offsite
    FormatCall NumberItem Location
    Text JSM 94-405 v. 57, no. 1 (Jan. 2008)Offsite
  • Conference proceedings : IMTC/94 : advanced technologies in I & M / Grand Hotel Hamamatsu, Hamamatsu, Japan, May 10-12, 1994 ; [sponsored by IEEE Instrumentation and Measurement Society, the Society of Instrument and Control Engineers, Japan]

    • Text
    • [New York] : IEEE ; Piscataway, NJ : IEEE Service Center, c1994 .
    • 1994
    • 3 Items
    FormatCall NumberItem Location
    Text JSF 95-62 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 95-62 v. 2Offsite
    FormatCall NumberItem Location
    Text JSF 95-62 v. 3Offsite
  • Conference proceedings : IMTC/95 : integrating intelligent instrumentation & control : 1995 IEEE Instrumentation/Measurement Technology Conference, Westin Hotel, Waltham, Massachusetts, April 23-26, 1995 / sponsors, IEEE Instrumentation and Measurement Society, IEEE Boston Section.

    • Text
    • [New York] : IEEE, c1995 .
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 95-888Offsite
  • Conference proceedings : IMTC/96, IMEKO TC-7 : Joint Conference-1996: IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7 : quality measurements: the indispensable bridge between theory and reality (no measurements? no science!), Sheraton Brussells Hotel & Tower, Brussels, Belgium, June 4-6, 1996 / sponsors, IEEE Instrumentation and Measurement Society, IMEKO Technical Committee 7, Vrije Universiteit Brussel, Dept. ELEC.

    • Text
    • [New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1996 .
    • 1996
    • 2 Items
    FormatCall NumberItem Location
    Text JSF 96-491 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 96-491 v. 2Offsite
  • IMTC proceedings : IMTC/97 IEEE Instrumentation & Measurement Technology Conference : sensing, processing, networking, Hotel Château Laurier, Ottawa, Canada, May 19-21, 1997 / sponsors, IEEE Instrumentation and Measurement Society, IEEE Ottawa Section.

    • Text
    • [New York] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1997.
    • 1997
    • 2 Items
    FormatCall NumberItem Location
    Text JSF 97-393 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 97-393 v. 2Offsite
  • Conference proceedings : IMTC/98, IEEE Instrumentation and Measurement Technology Conference : where instrumentation is going, The Saint Paul Hotel, St. Paul, Minnesota USA, May 18-21, 1998 / sponsors: IEEE Instrumentation and Measurement Society, IEEE Twin Cities Section.

    • Text
    • [New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1998.
    • 1998
    • 2 Items
    FormatCall NumberItem Location
    Text JSF 98-373 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 98-373 v. 2Offsite
  • IMTC/99 : Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference : Measurements for the New Millennium, Venice, Italy, May 24-26, 1999 / Organized and sponsored by the IEEE Instrumentation and Measurement Society, [et. al], edited by Vincenzo Piuri and Mario Savino.

    • Text
    • [New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1999.
    • 1999
    • 3 Items
    FormatCall NumberItem Location
    Text JSF 99-696 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 99-696 v. 2Offsite
    FormatCall NumberItem Location
    Text JSF 99-696 v. 3Offsite
  • Proceedings of the Technical Program : Electro 99 Conference : June 15-16, 1999, Bayside Exposition Center, Boston, Massachusetts / [sponsored by the IEEE Electromagnetic Compatibility Society and the IEEE Instrumentation and Measurement Society].

    • Text
    • Piscataway, New Jersey : IEEE, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 00-8Offsite
  • IMTC/2000 : Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference : Smart connectivity: integrating measurement and control, Hilton Hotel and Towers, Baltimore, Maryland, USA-May 1-4, 2000 / Organized and sponsored by the IEEE Instrumentation and Measurement Society ... [et al.].

    • Text
    • Piscataway, N.J. : IEEE Service Center, [2000], c1997.
    • 2000
    • 3 Items
    FormatCall NumberItem Location
    Text JSF 00-1047 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 00-1047 v. 2Offsite
    FormatCall NumberItem Location
    Text JSF 00-1047 v. 3Offsite
  • IMTC/2001 : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference : Rediscovering measurement in the age of informatics : Budapest Convention Centre, Budapest, Hungary, 21-23 May, 2001 / sponsored by IEEE Instrumentation and Measurement Society, Budapest University of Technology and Economics ; in cooperation with International Measurement Confederation (IMEKO).

    • Text
    • Piscataway, New Jersey : IEEE, c2001.
    • 2001
    • 3 Items
    FormatCall NumberItem Location
    Text JSF 02-163 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 02-163 v. 2Offsite
    FormatCall NumberItem Location
    Text JSF 02-163 v. 3Offsite
  • IMtc/2002 : proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference : The frontier of instrumentation and measurement : Anchorage Hilton Hotel, Anchorage, Alaska, USA--21-23 May, 2002 / sponsored by IEEE Instrumentation and Measurement Society.

    • Text
    • Piscataway, New Jersey : IEEE, c2001.
    • 2001
    • 2 Items
    FormatCall NumberItem Location
    Text JSF 02-732 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 02-732 v. 2Offsite
  • IMtc/03 : proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference : Instrumentation and measurement at the summit : Vail Cascade Hotel, Vail, Colorado, USA, 20-22 May, 2003 / organized and sponsored by the IEEE Instrumentation and Measurement Society.

    • Text
    • Piscataway, N.J. : IEEE, c2003.
    • 2003
    • 2 Items
    FormatCall NumberItem Location
    Text JSF 03-860 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 03-860 v. 2Offsite
  • IMTC/04 : proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference : From the electrometer to the networked instruments: a giant step toward a deeper knowledge : Como, Italy, May 18-20, 2004 / organized and sponsored by the IEEE Instrumentation and Measurement Society ; edited by Serge Demidenko ... [et al.].

    • Text
    • Piscataway, N.J. : IEEE, c2004.
    • 2004
    • 3 Items
    FormatCall NumberItem Location
    Text JSF 04-634 v. 1Offsite
    FormatCall NumberItem Location
    Text JSF 04-634 v. 2Offsite
    FormatCall NumberItem Location
    Text JSF 04-634 v. 3Offsite
  • Proceedings of the ... IEEE Instrumentation and Measurement Technology Conference / IMTC.

    • Text
    • [New York, N.Y.?] : IEEE, c1999-
    • 1999-present
    • 2 Items
    FormatCall NumberItem Location
    Text JSM 07-67 2005:v. 2Offsite
    FormatCall NumberItem Location
    Text JSM 07-67 2005:v. 1Offsite
  • Digest / organized by National Institute of Standards and Technology.

    • Text
    • [New York] : Institute of Electrical and Electronics Engineers.
    • 200-2000
    • 5 Items
    FormatCall NumberItem Location
    Text JSP 81-165 1996Offsite
    FormatCall NumberItem Location
    Text JSP 81-165 1998Offsite
    FormatCall NumberItem Location
    Text JSP 81-165 2000Offsite
  • IMTC '85 proceedings / IEEE Instrumentation and Measurement Technology Conference, March 20-22, 1985, Hyatt Regency Hotel, Tampa, FL.

    • Text
    • New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Order from IEEE Service Center, c1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 11-9Offsite
  • Proceedings / AUTOTESTCON 93, September 20-23, 1993, IEEE Systems Readiness Technology Conference, San Antonio Convention Center, San Antonio, Texas ; sponsored by the Institute of Electrical and Electronics Engineers Instrumentation and Measurement Society, Aerospace and Electronics Systems Society, IEEE Central Texas Section.

    • Text
    • [New York] : IEEE ; Piscataway, NJ : May be obtained from IEEE Service Center, [1993], ©1993.
    • 1993-1993
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.A8 A98 1993g 1993Off-site
  • Symposium proceedings / Autotestcon.

    • Text
    • New York, NY : Institute of Electrical and Electronics Engineers, [1988], ©1988.
    • 1988-1988
    • 1 Item
    FormatCall NumberItem Location
    Text TJ213 .A841 1988Off-site
  • Conference record / Autotestcon.

    • Text
    • New York, NY : IEEE, ©1989-
    • 1989-1992
    • 3 Items
    FormatCall NumberItem Location
    Text TJ213 .A841 1989Off-site
    FormatCall NumberItem Location
    Text TJ213 .A841 1990Off-site
    FormatCall NumberItem Location
    Text TJ213 .A841 1991Off-site
  • Conference record : Autotestcon '96 : test technology and commercialization, September 16-19, 1996, Dayton, Ohio / sponsored by The Institute of Electrical & Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society.

    • Text
    • [New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.A8 A98 1996gOff-site
  • EEMTIC'81 digest : Electrical and Electronic Measurement and Test Instrument Conference and Exposition, Ottawa, Canada / sponsors, IEEE Ottawa Section, Instrumentation and Measurement Society, Canadian and U.S. URSI-Commission A.

    • Text
    • New York, NY : Institute of Electrical and Electronics Engineers, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878 .E4 1981Off-site
  • IEEE transactions on instrumentation and measurement.

    • Text
    • New York, Institute of Electrical and Electronics Engineers [etc.]
    • 1952-present
    • 42 Items
    FormatCall NumberItem Location
    Text TK7800.In75 IM v.54:no.4-6 (2005)Off-site
    FormatCall NumberItem Location
    Text TK7800.In75 IM v.55:no.1-3 (2006)Off-site
    FormatCall NumberItem Location
    Text TK7800.In75 IM v.55:no.4-6 (2006)Off-site
  • IEEE instrumentation & measurement magazine.

    • Text
    • New York, NY : Institute of Electrical and Electronics Engineers, ©1998-
    • 1998-present
    • 8 Items
    FormatCall NumberItem Location
    Text TK7869 .I35 v.7 (2004)Off-site
    FormatCall NumberItem Location
    Text TK7869 .I35 v.8 (2005)Off-site
    FormatCall NumberItem Location
    Text TK7869 .I35 v.9 (2006)Off-site
  • Proceedings of the Technical Program : Electro 99 Conference : June 15-16, 1999, Bayside Exposition Center, Boston, Massachusetts / [sponsored by the IEEE Electromagnetic Compatibility Society and the IEEE Instrumentation and Measurement Society].

    • Text
    • Piscataway, New Jersey : IEEE, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7801 .E42 1999gOff-site
  • IEEE Autotestcon proceedings.

    • Text
    • [New York, N.Y.] : Institute of Electrical and Electronics Engineers, ©1997-
    • 1997-present
    • 7 Items
    FormatCall NumberItem Location
    Text TJ213 .A8411 2001Off-site
    FormatCall NumberItem Location
    Text TJ213 .A8411 2002Off-site
    FormatCall NumberItem Location
    Text TJ213 .A8411 2003Off-site
  • VIMS 2001 : 2001 IEEE International Workshop on Virtual and Intelligent Measurement Systems : Hotel Gellért, Budapest, Hungary, 19-20 May 2001 : integrating heterogeneous components into composite systems for quantitative intelligent virtual reality / sponsored by the IEEE Instrumentation and Measurement Society and organized by TC15- Technical Committee on Virtual Systems, TC22- Technical Committee on Intelligent Measurement Systems and by ISA, the Instrumentation, Systems and Automation Society.

    • Text
    • Piscataway, NJ : IEEE, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878 .I34 2001gOff-site
  • Autotestcon.

    • Text
    • [New York, N.Y.] : [Institute of Electrical and Electronics Engineers], [1976-1983], [©1976]-1983.
    • 1976-1983
    • 8 Items
    FormatCall NumberItem Location
    Text TJ213 .A84 1981Off-site
    FormatCall NumberItem Location
    Text TJ213 .A84 1982Off-site
    FormatCall NumberItem Location
    Text TJ213 .A84 1983Off-site
  • Proceedings of the first ISA/IEEE Sensors for Industry Conference : 5-7 November, 2001 Holiday Inn O'Hare International Rosemont Illinois / presented and sponsored by the ISA--The Instrumentation, Systems and Automation Society-- and the IEEE Instrumentation and Measurement Society.

    • Text
    • Piscataway, NJ : IEEE, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TA165 .S5 2001gOff-site
  • VIMS 2002 : 2002 IEEE International Symposium on Virtual and Intelligent Measurement Systems : Distributed intelligent sensing for advanced integrated virtual environments : Alyeska resort, Girdwood, Alaska, USA, 19-20 May 2002 / sponsored by the IEEE Instrumentation and Measurement Society [and others].

    • Text
    • Piscataway, New Jersey : IEEE, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878 .I34 2002gOff-site
  • Conference proceedings / IEEE Instrumentation/Measurement Technology Conference.

    • Text
    • [New York, N.Y.] : IEEE, [1994]-©1998.
    • 1994-1998
    • 10 Items
    FormatCall NumberItem Location
    Text TK7878 .I32951 1997 :v.2Off-site
    FormatCall NumberItem Location
    Text TK7878 .I32951 1998 :v.1Off-site
    FormatCall NumberItem Location
    Text TK7878 .I32951 1998 :v.2Off-site
  • Conference record / IEEE Instrumentation and Measurement Technology Conference.

    • Text
    • New York, N.Y. : IEEE, [1988-1993], ©1988-1993.
    • 1988-1993
    • 6 Items
    FormatCall NumberItem Location
    Text TK7878 .I32951 (1991)Off-site
    FormatCall NumberItem Location
    Text TK7878 .I32951 (1992)Off-site
    FormatCall NumberItem Location
    Text TK7878 .I32951 (1993)Off-site
  • Conference proceedings / IEEE Instrumentation and Measurement Technology Conference.

    • Text
    • New York, N.Y. : IEEE, [1987], ©1987.
    • 1987-1987
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878 .I32951 (1987)Off-site
  • Conference record / IEEE Instrumentation and Measurement [Technology] Conference.

    • Text
    • New York, N.Y. : IEEE, [1986], ©1986.
    • 1986-1986
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878 .I32951 (1986)Off-site
  • SIcon/02 : Sensors for Industry Conference : presented by ISA and IEEE : proceedings of the ISA/IEEE Sensors for Industry Conference : 19-21 November, 2002, Houston Marriott West Loop Hotel, Houston, Texas, USA / organized and sponsored by the ISA--The Instrumentation, Systems and Automation Society--and the IEEE Instrumentation and Measurement Society.

    • Text
    • Research Triangle Park, N.C. : ISA, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TA165 .S5 2002gOff-site
  • CPEM digest.

    • Text
    • New York [etc.] Institute of Electrical and Electronics Engineers [etc.]
    • 19-present
    • 16 Items
    FormatCall NumberItem Location
    Text QC670 .C58 1998Off-site
    FormatCall NumberItem Location
    Text QC670 .C58 2000Off-site
    FormatCall NumberItem Location
    Text QC670 .C58 2002Off-site
  • SCIMA 2003 : 2003 IEEE International Workshop on Soft Computing in Instrumentation, Measuremment and Related Applications : Brigham Young University, Provo, Utah, USA, 17 May, 2003 / organized by the Brigham Young University and the IEEE Instrumentation and Measurement Society--Technical Committee on Intelligent Measurement Systems ; technical cooperation by the IEEE I&M Society.

    • Text
    • Piscataway, N.J. : IEEE, c2003.
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.9.S63 I143 2003gOff-site
  • Proceedings / 2003 IEEE International Symposium on Intelligent Signal Processing ; [sponsored by IEEE Instrumentation and Measurement Society, IEEE Hungary Section].

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text TK5102.9 .I313 2003gOff-site
  • Proceedings / Autotestcon.

    • Text
    • New York, NY : Institute of Electrical and Electronics Engineers, [1984-1987], ©1984-1987.
    • 1984-1987
    • 4 Items
    FormatCall NumberItem Location
    Text TJ213 .A841 1985Off-site
    FormatCall NumberItem Location
    Text TJ213 .A841 1986Off-site
    FormatCall NumberItem Location
    Text TJ213 .A841 1987Off-site
  • Proceedings / IEEE Instrumentation and Measurement Technology Conference.

    • Text
    • [New York, N.Y.] : IEEE, 1984-1985.
    • 1984-1985
    • 2 Items
    FormatCall NumberItem Location
    Text TK7878 .I32951 (1984)Off-site
    FormatCall NumberItem Location
    Text TK7878 .I32951 (1985)Off-site
  • Proceedings of the ... IEEE Instrumentation and Measurement Technology Conference / IMTC.

    • Text
    • [New York, N.Y.?] : IEEE, ©1999-
    • 1999-present
    • 13 Items
    FormatCall NumberItem Location
    Text TK7878 .I32951 1999 v.3Off-site
    FormatCall NumberItem Location
    Text TK7878 .I32951 2000 v.3Off-site
    FormatCall NumberItem Location
    Text TK7878 .I32951 2001 v.3Off-site
  • Proceedings of the Technical Program : Electro 99 Conference : June 15-16, 1999, Bayside Exposition Center, Boston, Massachusetts / [sponsored by the IEEE Electromagnetic Compatibility Society and the IEEE Instrumentation and Measurement Society].

    • Text
    • Piscataway, New Jersey : IEEE, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7801.E433 1999Off-site
  • Conference record, Autotestcon '95, August 8-10, 1995 : Atlanta, Georgia / sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Eletronics Systems Society, Instrument and Measurement Society.

    • Text
    • Piscataway, NJ : IEEE Service Center, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK7895.A8 A98 1995Off-site
  • Conference proceedings : IMTC/96, IMEKO TC-7 : Joint Conference-1996: IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7 : quality measurements: the indispensable bridge between theory and reality (no measurements? no science!), Sheraton Brussells Hotel & Tower, Brussels, Belgium, June 4-6, 1996 / sponsors, IEEE Instrumentation and Measurement Society, IMEKO Technical Committee 7, Vrije Universiteit Brussel, Dept. ELEC.

    • Text
    • [New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878 .I3295 1996 vol.2Off-site
  • IMTC proceedings : IMTC/97, IEEE Instrumentation & Measurement Technology Conference : sensing, processing, networking : Hotel Château Laurier, Ottawa, Canada, May 19-21, 1997 / sponsors, IEEE Instrumentation & Measurement Society, IEEE Ottawa Section.

    • Text
    • Piscataway, N.J. : IEEE Service Center, c1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878 .I3295 1997 vol.2Off-site
  • IEEE instrumentation & measurement magazine.

    • Text
    • New York, NY : Institute of Electrical and Electronics Engineers, c1998-
    • 1998-present
    • 1 Item
    FormatCall NumberItem Location
    Text TK7881 .I285 vol. 9 2006Off-site

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