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Displaying 1-49 of 49 results for author "INSPEC (Information service)"
Thesaurus / INSPEC.
- Text
- [London] : Institution of Electrical Engineers, c1991-
- 1991-1999
- 4 Items
Item details Format Call Number Item Location Text JSP 78-99 1993 Offsite Item details Format Call Number Item Location Text JSP 78-99 1995 Offsite Item details Format Call Number Item Location Text JSP 78-99 1999 Offsite Properties of gallium arsenide.
- Text
- London ; New York : INSPEC, Institution of Electrical Engineers, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSF 87-735 Offsite Properties of amorphous silicon.
- Text
- London ; New York : INSPEC, Institution of Electrical Engineers, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSF 87-1111 Offsite Properties of amorphous silicon.
- Text
- London ; New York : INSPEC, Institution of Electrical Engineers, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSF 89-617 Offsite Key abstracts. Business automation.
- Text
- [Hitchin, England] : INSPEC, The Institution of Electrical Engineers ; [Piscataway, NJ] : Institute of Electrical and Electronics Engineers, 1989-
- 1989-present
- 1 Item
Item details Format Call Number Item Location Text JBM 90-737 Jan. 1989-Jan. 1993, inc. Schwarzman Building - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Properties of gallium arsenide.
- Text
- London ; New York : INSPEC, Institution of Electrical Engineers, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JSF 90-954 Offsite Properties of indium phosphide.
- Text
- London ; New York : INSPEC, The Institution of Electrical Engineers, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text JSG 91-150 Offsite List of journals and other serial sources.
- Text
- London, England : Institution of Electrical Engineers, 1983-
- 1983-present
- 3 Items
Item details Format Call Number Item Location Text JSM 97-139 1989 Offsite Item details Format Call Number Item Location Text JSM 97-139 1994/1995 Offsite Item details Format Call Number Item Location Text JSM 97-139 1997/1998 Offsite Science abstracts. Series A, Physics abstracts.
- Text
- London : Institution of Electrical Engineers, c1967-
- 1967-present
- 594 Items
Item details Format Call Number Item Location Text JSM 95-251 no. 239854-250538 (Dec 15, 2007) Offsite Item details Format Call Number Item Location Text JSM 95-251 no. 248399-256906 (Dec 1, 2006) Offsite Item details Format Call Number Item Location Text JSM 95-251 no. 256907-271846 (Dec 15, 2006) Offsite Properties of lattice-matched and strained indium gallium arsenide / edited by Pallab Bhattacharya.
- Text
- London : INSPEC, the Institution of Electrical Engineers, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSF 94-336 Offsite Properties of group III nitrides / edited by James H. Edgar.
- Text
- London : INSPEC, Institution of Electrical Engineers, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text JSF 95-323 Offsite Properties of narrow gap cadmium-based compounds / edited by Peter Capper.
- Text
- London : INSPEC, the Institution of Electrical Engineers, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text JSF 94-747 Offsite Properties of strained and relaxed silicon germanium / edited by Erich Kasper.
- Text
- London : INSPEC, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text JSF 95-462 Offsite Properties of metal silicides / edited by Karen Maex and Marc van Rossum.
- Text
- Stevenage : INSPEC, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text JSF 96-25 Offsite Properties of III-V quantum wells and superlattices / edited by Pallab Bhattacharya.
- Text
- Stevenage : INSPEC, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text JSF 96-687 Offsite Properties of gallium arsenide / edited by M.R. Brozel and G.E. Stillman.
- Text
- London : INSPEC, 1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text JSF 97-76 Offsite Properties of porous silicon / edited by Leigh Canham.
- Text
- London : INSPEC, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text JSF 98-123 Offsite Properties of silicon carbide / edited by Gary L. Harris.
- Text
- London : INSPEC, Institution of Electrical Engineers, c1995.
- 1995
- 2 Items
Item details Format Call Number Item Location Text JSF 98-355 Offsite Item details Format Call Number Item Location Text JSF 98-355 2nd copy Offsite Properties of crystalline silicon / edited by Robert Hull.
- Text
- London : INSPEC, the Institution of Electrical Engineers, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSF 00-397 Offsite Tapes 73 : proceedings of the first INSPEC Tape Workshop, held in London, February 6-8th, 1973.
- Text
- London : INSPEC, Institution of Electrical Engineers, c1973.
- 1973
- 1 Item
Item details Format Call Number Item Location Text JSG 00-98 Offsite Properties of silicon germanium and SiGe:Carbon / edited by Erich Kasper and Klara Lyutovich.
- Text
- London : INSPEC, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Text JSF 00-821 Offsite INSPEC ondisc.
- Text
- Ann Arbor, MI : University Microfilms.
- unknown-present
- 7 Items
Item details Format Call Number Item Location Text *WSC-43 2002:Jan. -June Offsite Item details Format Call Number Item Location Text *WSC-43 2002:Jan. -Mar. Offsite Item details Format Call Number Item Location Text *WSC-43 2002:Jan. -Sept. Offsite Properties of indium phosphide.
- Text
- London ; New York : INSPEC, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TK7871.15.I53 P76 1991 Off-site Properties of gallium arsenide.
- Text
- London ; New York : INSPEC, The Institution of Electrical Engineers, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text TK7871.15.G3 P76 1990 Off-site List of journals and other serial sources.
- Text
- London, England : Institution of Electrical Engineers, 1983-
- 1983-present
- 1 Item
Item details Format Call Number Item Location Text Z7143 .I57 1996/7 Off-site Properties of aluminium gallium arsenide / edited by Sadao Adachi.
- Text
- Stevenage, Herts., UK : IEE : INSPEC, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7871.15.G3 P767 1993g Off-site Properties of lattice-matched and strained indium gallium arsenide / edited by Pallab Bhattacharya.
- Text
- London : INSPEC, the Institution of Electrical Engineers, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.C65 P78 1993g Off-site Properties of strained and relaxed silicon germanium / edited by Erich Kasper.
- Text
- London : INSPEC, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .P76 1995 Off-site Properties of narrow gap cadmium-based compounds / edited by Peter Capper.
- Text
- London : INSPEC, the Institution of Electrical Engineers, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text QC612.S4 C3 1994g Off-site Properties of group III nitrides / edited by James H. Edgar.
- Text
- London : INSPEC, Institution of Electrical Engineers, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text TA455.N5 P76 1994g Off-site Properties and growth of diamond / edited by Gordon Davies.
- Text
- London, U.K. : INSPEC, the Institution of Electrical Engineers, [1994], ©1994.
- 1994-1994
- 1 Item
Item details Format Call Number Item Location Text QE393 .P75 1994g Off-site Properties of silicon carbide / edited by Gary L. Harris.
- Text
- London : INSPEC, Institution of Electrical Engineers, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TP261.C3 P76 1995 Off-site Properties of gallium arsenide / edited by M.R. Brozel and G.E. Stillman.
- Text
- London : INSPEC, 1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TK7871.15.G3 P76 1996g Off-site Properties of porous silicon / edited by Leigh Canham.
- Text
- London : IEE : INSPEC, The Institution of Electrical Engineers, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TK7871.15.S55 P75 1997g Off-site Properties of III-V quantum wells and superlattices / edited by Pallab Bhattacharya.
- Text
- Stevenage : INSPEC, [1996], ©1996.
- 1996-1996
- 1 Item
Item details Format Call Number Item Location Text QC176.8.Q35 P76 1996g Off-site Properties of metal silicides / edited by Karen Maex and Marc van Rossum.
- Text
- Stevenage : INSPEC, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7871.15.S54 P76 1995g Off-site Properties of amorphous silicon.
- Text
- London ; New York : INSPEC, Institution of Electrical Engineers, [1985], ©1985.
- 1985-1985
- 1 Item
Item details Format Call Number Item Location Text QD181.S6 P78 1985 Off-site Properties of lithium niobate / edited by K.K. Wong.
- Text
- London : INSPEC/Institution of Electrical Engineers, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text QD181.L5 P767 2002g Off-site Properties of amorphous silicon.
- Text
- London ; New York : INSPEC, Institution of Electrical Engineers, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text QD181.S6 P78 1989 Off-site Properties of silicon.
- Text
- London ; New York : INSPEC, Institution of Electrical Engineers, [1988], ©1988.
- 1988-1988
- 1 Item
Item details Format Call Number Item Location Text TK7871.15.S55 P76 1988 Off-site Classification : a classification scheme for the INSPEC database /cINSPEC
- Text
- [London] : Institution of Electrical Engineers, [1991-
- 1991-present
- 2 Items
Item details Format Call Number Item Location Text Z697.S5C57q 1999 Off-site Item details Format Call Number Item Location Text Z697.S5C57q 1991 Off-site List of journals and other serial sources.
- Text
- London : Institution of Electrical Engineers, 1983-
- 1983-present
- 2 Items
Item details Format Call Number Item Location Text Z7143 .I57a 1991/1992 Off-site Item details Format Call Number Item Location Text Z7143 .I57a 2002/2003 Off-site Thesaurus / INSPEC.
- Text
- [London] : Institution of Electrical Engineers, c1991-
- 1991-present
- 1 Item
Item details Format Call Number Item Location Text Z695.1.P5 I57q 1999 Off-site Properties of porous silicon / edited by Leigh Canham.
- Text
- London, U.K. : IEE, INSPEC, ©1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text QD181.S6 P766 1997 Off-site Classification : a classification scheme for the INSPEC database /cINSPEC
- Text
- [London] : Institution of Electrical Engineers, [1991-
- 1991-present
- 2 Items
Item details Format Call Number Item Location Text Z697.S5 C57q 1991 Off-site Item details Format Call Number Item Location Text Z697.S5 C57q 1999 Off-site List of journals and other serial sources.
- Text
- London : Institution of Electrical Engineers, 1983-
- 1983-present
- 2 Items
Item details Format Call Number Item Location Text Z7143 .I57a 1991/1992 Off-site Item details Format Call Number Item Location Text Z7143 .I57a 2002/2003 Off-site Properties of gallium arsenide.
- Text
- London ; New York : INSPEC, Institution of Electrical Engineers, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text TK7871.15.G3 P76 1990 Off-site Properties of aluminium gallium arsenide / edited by Sadao Adachi.
- Text
- London : IEE, INSPEC, ©1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text QC611.8.G3 P766 1993 Off-site Thesaurus / INSPEC.
- Text
- [London] : Institution of Electrical Engineers, c1991-
- 1991-present
- 1 Item
Item details Format Call Number Item Location Text Z695.1.P5 I57q Oversize 1999 Off-site
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