Research Catalog

  • Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado / sponsored by SPIE--the International Society for Optical Engineering, IDEMA, [and] Information Technology Lab./National Institute of Standards and Technology ; [Fernando Luis Podio, chair/editor].

    • Text
    • Bellingham, Wash., USA : SPIE, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TA1635 .R43 1999gOff-site

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