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Displaying 1-1 of 1 results for author "Kishnan, S."
2002 8th International Symposium on Plasma- and Process-Induced Damage : April 24-25, 2003, Corbeil-Essonnes, France / Koji Eriguchi, S. Krishnan, and Terence Hook, editors ; [technical co-sponsors, IEEE/Electron Devices Society, Japanese Society of Applied Physics].
- Text
- Pisctaway, N.J. : IEEE, c2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I5834 2003g Off-site
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