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Displaying 1-9 of 9 results for author "Lowell, John."
Decisions of Hon. Peleg Sprague in maritime, admiralty, & prize causes in the District court of the United States for the district of Massachusetts, 1841-[1864] ...
- Text
- Boston, Little, 1861-1868.
- 1861-1868
- 2 Items
Available Online
http://babel.hathitrust.org/cgi/pt?id=nyp.33433007122900Item details Format Call Number Item Location Text XO (United States. Courts: District Court for the District of Massachusetts. Decisions of Hon. Peleg Sprague) v. 1 Offsite Item details Format Call Number Item Location Text XO (United States. Courts: District Court for the District of Massachusetts. Decisions of Hon. Peleg Sprague) v. 2 Offsite Electronic and photonic circuits and devices / edited by Ronald W. Waynant, John K. Lowell.
- Text
- New York : Institute of Electrical and Electronics Engineers, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSF 99-626 Offsite Supplementary report of the special committee on the subject of a national bankrupt law ... Also, a revised sketch of an act to establish a uniform system of bankruptcy throughout the United States, prepared by John Lowell.
- Text
- New York, [n.p.] 1880.
- 1880
- 1 Item
Item details Format Call Number Item Location Text TLX p.v. 4 no. 1-16 Schwarzman Building - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas / Jagdish P. Mathur, John Lowell, Ray T. Chen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .O57 1995g Off-site Electronic and photonic circuits and devices / edited by Ronald W. Waynant, John K. Lowell.
- Text
- New York : Institute of Electrical and Electronics Engineers, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7867 .E36 1998 Off-site Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas / John Lowell, Ray T. Chen, Jagdish P. Mathur, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering, cooperating organization SEMI--Semiconductor Equipment and Materials International.
- Text
- Bellingham, Wash., USA : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .O6742 1995 Off-site Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas / Jagdish P. Mathur, John Lowell, Ray T. Chen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7871.85.O674 1994 Off-site Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas / John Lowell, Ray T. Chen, Jagdish P. Mathur, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering, cooperating organization SEMI--Semiconductor Equipment and Materials International.
- Text
- Bellingham, Wash., USA : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .O6742 1995 Off-site Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas / Jagdish P. Mathur, John Lowell, Ray T. Chen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .O674 1994 Off-site
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