Research Catalog

  • Protocol test systems : proceedings of the IFIP TC6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989 / edited by Jan de Meer, Lothar Mackert, Wolfgang Effelsberg.

    • Text
    • Amsterdam ; New York : North-Holland ; New York, N.Y. : Distributors for the U.S. and Canada, Elsevier Pub. Co., 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK5105.5 I34243 1989Off-site

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