Research Catalog

  • Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas / Jagdish P. Mathur, John Lowell, Ray T. Chen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1995], ©1995.
    • 1995-1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .O57 1995gOff-site
  • Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas / John Lowell, Ray T. Chen, Jagdish P. Mathur, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering, cooperating organization SEMI--Semiconductor Equipment and Materials International.

    • Text
    • Bellingham, Wash., USA : SPIE, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .O6742 1995Off-site
  • Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas / Jagdish P. Mathur, John Lowell, Ray T. Chen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85.O674 1994Off-site
  • Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas / John Lowell, Ray T. Chen, Jagdish P. Mathur, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering, cooperating organization SEMI--Semiconductor Equipment and Materials International.

    • Text
    • Bellingham, Wash., USA : SPIE, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .O6742 1995Off-site
  • Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas / Jagdish P. Mathur, John Lowell, Ray T. Chen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .O674 1994Off-site

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