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Displaying 1-1 of 1 results for author "Maxwell, Dwight A."
A production-compatible microelectronic test pattern for evaluating photomask misalignment / T. J. Russell, D. A. Maxwell, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards ; sponsored by the National Bureau of Standards and Advanced Research Projects Agency.
- Text
- Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., 1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-51 Off-site
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