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Displaying 1-2 of 2 results for author "Michaloski, John."
End-to-end demonstration of the Quality Information Framework (QIF) standard at the International Manufacturing Technology Show (IMTS) 2014 / Hui-Min Huang; John Michaloski; Daniel Campbell; Robert Stone; Thomas Kramer; Curtis Brown; Robert Brown; Gavrail Tatarliev.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
- 2016
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95880End-to-end Quality Information Framework (QIF) technology survey / John Michaloski; Tom Hedberg; Hui Huang; Thomas Kramer.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
- 2016
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo103834
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