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Displaying 1-1 of 1 results for author "Modi, Mukund U."
Chip-to-system test concerns for the 90's ; digest of papers, 1991 IEEE VLSI Test Symposium, April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA / sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section ; [Mukund U. Modi, general chairperson].
- Text
- New York, NY : IEEE, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I325 1991g Off-site
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