Research Catalog

  • Thermal resistance measurements on power transistors / Sherwin Rubin and Frank F. Oettinger, Electron Devices Division, Center for Electronics and Electrical Engineering, National Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-14Off-site

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