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Displaying 1-3 of 3 results for author "Passaglia, Elio"
Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.
- Text
- Washington : U.S. National Bureau of Standards, 1964.
- 1964
- 1 Item
Item details Format Call Number Item Location Text QC443 .Sy68 1963 Off-site Research on laser standards and materials at the National Bureau of Standards / Karl G. Kessler, Elio Passaglia, and Nicholas N. Winogradoff, editors.
- Text
- [Washington, D.C.] : National Bureau of Standards, 1968.
- 1968
- 1 Item
Item details Format Call Number Item Location Text 8272.519 Off-site Ellipsometry in the measurement of surfaces and thin films; symposium proceedings.
- Text
- Washington, U.S. National Bureau of Standards, 1964.
- 1964
- 1 Item
Item details Format Call Number Item Location Text 8273.893.1963 Off-site
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