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Displaying 1-3 of 3 results for author "Potzick, James E."
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems [microform] : standard reference materials / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1992]
- 1992
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems [microform] / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1992.
- 1992
Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
- 1991
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