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Displaying 1-2 of 2 results for author "Rao, Gopal."
Microelectronic manufacturing yield, reliability, and failure analysis : 25-26 October 1995, Austin, Texas / Gopal Rao, Massimo Piccoli, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization SEMI--Semiconductor Equipment and Materials International.
- Text
- Bellingham, Wash. : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M525 1995 Off-site Microelectronic manufacturing yield, reliability, and failure analysis : 25-26 October 1995, Austin, Texas / Gopal Rao, Massimo Piccoli, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization SEMI--Semiconductor Equipment and Materials International.
- Text
- Bellingham, Wash. : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M525 1995 Off-site
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