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Displaying 1-1 of 1 results for author "Schnabel, C. M."
Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes [microform] / C.M. Schnabel ... [et al.].
- Text
- [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 2000]
- 2000
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