Research Catalog

  • Solder joint reliability prediction for multiple environments / by Andrew Eugene Perkins, Suresh K. Sitaraman.

    • Text
    • New York ; London : Springer, 2008.
    • 2008
    • 1 Item
    FormatCall NumberItem Location
    Text TK7870.15 .P47 2009gOff-site
  • Packaging, reliability and manufacturing issues associated with electronic and photonic products / presented at the 2001 ASME International Mechanical Engineering Congress and Exposition, November 11-16, 2001, New York, New York ; sponsored by the Electronic and Photonic Packaging Division, ASME ; edited by Suresh Sitaraman ... [et al.].

    • Text
    • New York, N.Y. : ASME, c2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7870.15 .I585 2001Off-site
  • Solder joint reliability prediction for multiple environments / by Andrew Eugene Perkins, Suresh K. Sitaraman.

    • Text
    • New York ; London : Springer, 2008.
    • 2008
    • 1 Item
    FormatCall NumberItem Location
    Text TK7870.15 .P475 2009Off-site
  • Solder joint reliability prediction for multiple environments / by Andrew Eugene Perkins, Suresh K. Sitaraman.

    • Text
    • New York ; London : Springer, 2008.
    • 2008
    • 1 Item
    FormatCall NumberItem Location
    Text TK7870.15 .P475 2009Off-site

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