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Displaying 1-1 of 1 results for author "Swanson, Richard M."
Measurement of carrier transport and recombination parameter in heavily doped silicon [microform] : final report.
- Text
- Stanford, CA : Solid State Electronics Laboratory, Stanford Electronics Laboratories, Dept. of Electrical Engineering, Stanford University ; [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1986-
- 1986-present
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