Research Catalog
New! Try our Article Search to discover online journals, books, and more from home with your library card.
Displaying 1-1 of 1 results for author "Swirhun, Stanley Edward."
Measurement of carrier transport and recombination parameter in heavily doped silicon [microform] : final report.
- Text
- Stanford, CA : Solid State Electronics Laboratory, Stanford Electronics Laboratories, Dept. of Electrical Engineering, Stanford University ; [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1986-
- 1986-present
No results found from Digital Research Books Beta
Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.
