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Displaying 1-1 of 1 results for author "Tsui, Ting Y."
Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A. / editors Ting Y. Tsui [and others].
- Text
- Warrendale, Pennsylvania : Materials Research Society, 2006.
- 2006
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .M36783 2006g Off-site
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