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Displaying 1-1 of 1 results for author "University of Florida. Department of Electrical Engineering."
The theoretical and experimental study of the temperature and dopant density dependence of hole mobility, effective mass, and resistivity in boron-doped silicon / Sheng S. Li, Department of Electrical Engineering, University of Florida.
- Text
- [Washington] : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
- 1978
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-47 Off-site
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