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Displaying 1-2 of 2 results for author "Uy, O. Manuel."
Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA / Philip T.C. Chen, O. Manuel Uy, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TL946 .O64 2000 Off-site Optical system contamination : effects, measurements, and control VII : 9-11 July, 2002, Seattle, [Washington] USA / Philip T.C. Chen, O. Manuel Uy, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) [and others].
- Text
- Bellingham, Washington : SPIE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text QC372 .O6 2002g Off-site
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