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Displaying 1-11 of 11 results for author "Varner, Ruth N."
OMNITAB II user's reference manual [by] David Hogben, Sally T. Peavy, and Ruth N. Varner.
- Text
- [Gaithersburg, Md.] National Bureau of Standards; for sale by the Supt. of Docs., U. S. Govt. Print. Off., Washington, 1971.
- 1971
- 1 Item
Item details Format Call Number Item Location Text JSF 78-578 (1977 suppl.) Offsite Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems [microform] : standard reference materials / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1992]
- 1992
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems [microform] / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1992.
- 1992
Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
- 1991
Standard reference materials : antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems / Carol F. Vezzetti, Ruth N. Varner.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
- 1992
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo103777Standard reference materials : antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems / Carol F. Vezzetti, Ruth N. Varner.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
- 1992
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo96492Standard reference materials : bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems / Carol F. Vezzetti, Ruth N. Varner.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
- 1991
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo96720Interlaboratory study on linewidth measurements for antireflective chromium photomasks / John M. Jerke, M. Carroll Croarkin, Ruth N. Varner.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982.
- 1982
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo94556Measurement assurance for dimensional measurements on integrated-circuit photomasks / Carroll Croarkin, Ruth N. Varner.
- Text
- Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1982.
- 1982
Source listing of OMNITAB II program / [by] Sally T. Peavy, Ruth N. Varner, and David Hogben.
- Text
- Washington : U.S. National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1970 [i.e. 1971]
- 1971
- 1 Item
Item details Format Call Number Item Location Text QA76.5 .P42 Off-site A systems programmer's guide for implementing OMNITAB II [by] Sally T. Peavy, Ruth N. Varner, and Shirley G. Bremer.
- Text
- Washington, U.S. National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1970.
- 1970
- 1 Item
Item details Format Call Number Item Location Text 81075.7045 Off-site
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