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Displaying 1-1 of 1 results for author "Ziegler, J. F. (James F.)."
Ion beam surface layer analysis; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation. Edited by: James W. Mayer and James F. Ziegler.
- Text
- Lausanne, Elsevier Sequoia S. A., [distributed in the U. S. A. by American Elsevier Publishing Co., New York] 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Text JSE 76-264 Offsite Not available - Please for assistance.
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