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Displaying 1-1 of 1 results for author "Benavides, Jeannette."
Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity [microform] / Jeannette Benavides.
- Text
- Greenbelt, Md. : National Aeronautics and Space Administration, Goddard Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor], 1997.
- 1997
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