Research Catalog

  • P-polarized reflectance spectroscopy [microform] : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions / Nikolaus Dietz and Klaus J. Bachmann.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
    • 1995

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