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Displaying 1-3 of 3 results for author "Geist, Jon."
Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / Jon Geist; M. Yaqub Afridi.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.
- 2015
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo99585A water bath blackbody for the 5 to 60 [degree] temperature range : performance goal, design concept, and test results / Jon. Geist.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1986.
- 1986
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95100Optical radiation measurements : Fundamental principles of absolute radiometry and the philosophy of this NBS program (1968 to 1971) / Jon Geist.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1972.
- 1972
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo104780
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