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Displaying 1-7 of 7 results for author "Goodhew, Peter J."
Specimen preparation in materials science, [by] P. J. Goodhew.
- Text
- Amsterdam, North-Holland Pub. Co., New York, American Elsevier Pub. Co., 1973 [c1972]
- 1973-1972
- 1 Item
Item details Format Call Number Item Location Text JSD 75-202 Offsite Specimen preparation in materials science [by] P.J. Goodhew. Including Electron diffraction and optical diffraction techniques [by] B.E.P. Beeston, Robert W. Horne and Roy Markham.
- Text
- Amsterdam : North Holland; New York, American Elsevier, 1972.
- 1972
- 1 Item
Item details Format Call Number Item Location Text JSK 73-230 1 Offsite Thin foil preparation for electron microscopy / P.J. Goodhew.
- Text
- Amsterdam ; New York : Elsevier, 1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 P7 v.11 Off-site Electron microscopy and analysis / P.J. Goodhew & F.J. Humphreys.
- Text
- London ; New York : Taylor & Francis, 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 G62 1988 Off-site Electron microscopy and analysis / P. J. Goodhew.
- Text
- London : Wykeham Publications ; New York : Springer-Verlag, 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 G62 Off-site Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.
- Text
- London ; New York : Taylor & Francis, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 G62 2001 2001 Off-site Electron microscopy and analysis / P. J. Goodhew.
- Text
- London : Wykeham Publications ; New York : Springer-Verlag, 1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text QH212.E4G652 1975 Off-site
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