Research Catalog

  • Specimen preparation in materials science, [by] P. J. Goodhew.

    • Text
    • Amsterdam, North-Holland Pub. Co., New York, American Elsevier Pub. Co., 1973 [c1972]
    • 1973-1972
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 75-202Offsite
  • Specimen preparation in materials science [by] P.J. Goodhew. Including Electron diffraction and optical diffraction techniques [by] B.E.P. Beeston, Robert W. Horne and Roy Markham.

    • Text
    • Amsterdam : North Holland; New York, American Elsevier, 1972.
    • 1972
    • 1 Item
    FormatCall NumberItem Location
    Text JSK 73-230 1Offsite
  • Thin foil preparation for electron microscopy / P.J. Goodhew.

    • Text
    • Amsterdam ; New York : Elsevier, 1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4 P7 v.11Off-site
  • Electron microscopy and analysis / P.J. Goodhew & F.J. Humphreys.

    • Text
    • London ; New York : Taylor & Francis, 1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4 G62 1988Off-site
  • Electron microscopy and analysis / P. J. Goodhew.

    • Text
    • London : Wykeham Publications ; New York : Springer-Verlag, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4 G62Off-site
  • Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.

    • Text
    • London ; New York : Taylor & Francis, c2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4 G62 2001 2001Off-site
  • Electron microscopy and analysis / P. J. Goodhew.

    • Text
    • London : Wykeham Publications ; New York : Springer-Verlag, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.E4G652 1975Off-site

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