Research Catalog

  • An analysis of the effects of secondary reflections on dual-frequency reflectometers [microform] / C.P. Hearn, C.R. Cockrell, S.D. Harrah.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1990]
    • 1990
  • Q-circle measurement error [microform] / Chase P. Hearn and Edward S. Bradshaw.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; [Springfield, Va. : For sale by the National Technical Information Service], 1991.
    • 1991
  • Reflectometer distance measurement between parallel conductive plates [microform] / Chase P. Hearn and Robert T. Neece.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; Springfield, VA : Available from the National Technical Information Service, [1995]
    • 1995
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS60787
  • Linearity optimization in a class of analog phase modulators [microform] / Chase P. Hearn.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1985.
    • 1985

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