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Displaying 1-2 of 2 results for author "IEEE International Conference on Microelectronic Test Structures (1993 : Barcelona, Spain)"
ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain / sponsored by the IEEE Electron Devices Society.
- Text
- New York, NY : Institute of Electrical and Electronics Engineers, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSF 94-113 Offsite ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain / sponsored by the IEEE Electron Devices Society.
- Text
- 1993
- 1 Item
Item details Format Call Number Item Location Text TK7874.I3236 1993 Off-site
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