Research Catalog

  • ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.

    • Text
    • Washington, DC : International Test Conference ; Piscataway New Jersey : IEEE, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSF 99-847Offsite

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