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Displaying 1-3 of 3 results for author "International Test Conference (31st : 2000 : Atlantic City, N.J.)"
ITC : International Test Conference 2000 : proceedings : October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.
- Text
- Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Book/Text JSF 01-146 Offsite Proceedings : International Test Conference 2000.
- Text
- Washington, D.C. : International Test Conference, c2000.
- 2000
- 1 Item
Available Online
http://ieeexplore.ieee.org/servlet/opac?punumber=7183Item details Format Call Number Item Location Book/Text TK7874 .I593 2000 Off-site Proceedings : International Test Conference 2000.
- Text
- Washington, D.C. : International Test Conference, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Book/Text TK7874 .I593 2000 Off-site
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