Research Catalog

  • Automated photomask inspection / Donald B. Novotny and Dino R. Ciarlo.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-46Off-site

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