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Displaying 1-1 of 1 results for author "Oldham, Timothy R."
Ionizing radiation effects in MOS oxides / Timothy R. Oldham.
- Text
- Singapore ; River Edge, NJ : World Scientific, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7871.99.M44 O42 1999 Off-site
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